{"id":{"repo_id":"uiuc","oai_identifier":"oai:www.ideals.illinois.edu:2142/129987"},"canonical_url":"https://search.dev.ndltd.org/etd/uiuc/oai:www.ideals.illinois.edu:2142/129987","repository":{"repo_id":"uiuc","name":"University of Illinois - Urbana-Champaign","base_url":"https://www.ideals.illinois.edu/oai-pmh"},"display":{"title":"Mitigation of simultaneous switching noise by active rail clamps","abstract":"Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2025-10-20 without embargo terms","abstract_html":"Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2025-10-20 without embargo terms","abstract_has_math":false,"creators":["Wasowicz, Alec"],"institution":"University of Illinois Urbana-Champaign","degree_name":"M.S.","degree_level":"Thesis","degree_discipline":"Electrical and Computer Engineering","degree_department":null,"school":null,"contributors":["Rosenbaum, Elyse"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2025,"date_issued":"2025-07-25","date_published":"2025-07-25","updated_at":"2026-07-22T22:25:06Z","subjects":["Simultaneous Switching Noise","Electrostatic Discharge"],"languages":["en","eng"],"rights":["Copyright 2025 Alec Wasowicz"],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"https://hdl.handle.net/2142/129987","outbound_label":"Handle","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Rosenbaum, Elyse"]},{"key":"dc:creator","label":"Author","values":["Wasowicz, Alec"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2025-07-25","2025-08"]},{"key":"dc:type","label":"Dc Type","values":["text"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical and Computer Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Thesis"]},{"key":"thesis:degree_name","label":"Degree Name","values":["M.S."]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["University of Illinois Urbana-Champaign"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Simultaneous Switching Noise","Electrostatic Discharge"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["en","eng"]},{"key":"dc:rights","label":"Dc Rights","values":["Copyright 2025 Alec Wasowicz"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["https://hdl.handle.net/2142/129987"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2025-10-20 without embargo terms","The student, Alec Wasowicz, accepted the attached license on 2025-07-23 at 18:36.","The student, Alec Wasowicz, submitted this Thesis for approval on 2025-07-23 at 18:42.","This Thesis was approved for publication on 2025-07-25 at 09:13.","DSpace SAF Submission Ingestion Package generated from Vireo submission #22718 on 2025-10-20 at 20:15:44","In integrated circuits with large amounts of digital switching, conditions may exist such that a significant amount of simultaneous switching noise (SSN) will be present. Low-speed products such as microcontrollers use less advanced packaging technologies, increasing the amplitude of the voltage excursions created by SSN. Overvoltages can lead to reliability issues that degrade transistor lifetime. This work investigates if the overvoltages due to SSN can be mitigated using rail clamp circuits developed for on-chip protection against electrostatic discharge (ESD)."]},{"key":"dc:format","label":"Dc Format","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["Mitigation of simultaneous switching noise by active rail clamps"]}]}],"canonical_facts":{"dc:contributor":["Rosenbaum, Elyse"],"dc:creator":["Wasowicz, Alec"],"dc:date":["2025-07-25","2025-08"],"dc:description":["Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2025-10-20 without embargo terms","The student, Alec Wasowicz, accepted the attached license on 2025-07-23 at 18:36.","The student, Alec Wasowicz, submitted this Thesis for approval on 2025-07-23 at 18:42.","This Thesis was approved for publication on 2025-07-25 at 09:13.","DSpace SAF Submission Ingestion Package generated from Vireo submission #22718 on 2025-10-20 at 20:15:44","In integrated circuits with large amounts of digital switching, conditions may exist such that a significant amount of simultaneous switching noise (SSN) will be present. Low-speed products such as microcontrollers use less advanced packaging technologies, increasing the amplitude of the voltage excursions created by SSN. Overvoltages can lead to reliability issues that degrade transistor lifetime. This work investigates if the overvoltages due to SSN can be mitigated using rail clamp circuits developed for on-chip protection against electrostatic discharge (ESD)."],"dc:format":["application/pdf"],"dc:identifier":["https://hdl.handle.net/2142/129987"],"dc:language":["en","eng"],"dc:rights":["Copyright 2025 Alec Wasowicz"],"dc:subject":["Simultaneous Switching Noise","Electrostatic Discharge"],"dc:title":["Mitigation of simultaneous switching noise by active rail clamps"],"dc:type":["text"],"thesis:degree_discipline":["Electrical and Computer Engineering"],"thesis:degree_level":["Thesis"],"thesis:degree_name":["M.S."],"thesis:institution_name":["University of Illinois Urbana-Champaign"]},"updated_at":"2026-07-22T22:25:06Z"}