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University of Illinois Urbana-Champaign
Atomic-scale engineering of 2D materials via scanning tunneling microscopy: Bridging synthesis, characterization, and device integration for post-silicon electronics
Abstract
dc:descriptionSubmission published under a 24 month embargo labeled 'Closed Access', the embargo will last until 2027-05-01
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Electrical & Computer Engr
- Grantor
- University of Illinois Urbana-Champaign
- Year dc:date
- 2025
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Wang, Hanfei
- Contributors dc:contributor
-
- Lyding, Joseph W
- Rakheja, Shaloo
- Zhu, Wenjuan
- Sinitskii, Alexander
Subjects
dc:subject × 5Rights
dc:rights- Statement dc:rights
-
- © 2025 Hanfei Wang
- Language dc:language
- en, eng
Identifiers
dc:identifier.*- Handle dc:identifier
- https://hdl.handle.net/2142/129767
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/129767