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University of Illinois Urbana-Champaign

Understanding and improving students’ testing experiences in large-scale computer science and other STEM courses

Abstract

dc:description

Computerized exams are becoming increasingly common for computer science courses and large enrollment classes, generally. At several institutions, faculty have adopted a Computer-Based Testing Facility (CBTF) to administer computerized exams. However, despite the benefits of the CBTF, there are concerns from students that the CBTF testing setup leads to negative experiences. Consequently, we conducted research on how the testing configurations typically used in a CBTF environment impact students’ testing experiences. We focused primarily on test anxiety due to its harmful impacts. We conducted a year-long experiment to measure test anxiety in the CBTF, comparing that to a second setup that may be characterized as Bring Your Own Device (BYOD). In this dissertation, the results of the experiment are reported. We found that the CBTF did not lead higher test anxiety or diminished performance among students, either for CS students or non-CS students in engineering departments. Additionally, we conducted research on fairness considerations for question variants on programming exams, which are often used for large-scale exams in a CBTF setting (and in some other contexts). We found that students’ fairness concerns were not associated with whether they had received the harder versions of questions on exams, but rather, were tied to lower overall performance in a course. Finally, we share findings from a study on second-chance testing, a promising approach for mitigating students’ test anxiety and improving outcomes and experiences in their courses. Students reported that the opportunity for second-chance testing would reduce test anxiety by 30%. This is noteworthy, as second-chance testing can be deployed at marginal cost in a CBTF environment. Taken together, this dissertation provides key insights to CS and other STEM instructors for effective testing at scale.

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Computer Science
Grantor
University of Illinois Urbana-Champaign
Year dc:date
2025

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Emeka, Chinedu Alexander
Contributors dc:contributor
  • Zilles, Craig
  • Lewis, Colleen
  • Silva, Mariana
  • West, Matthew
  • Fox, Armando

Subjects

dc:subject × 4

Rights

dc:rights
Statement dc:rights
  • Copyright 2025 Chinedu Emeka
Language dc:language
en, eng

Identifiers

dc:identifier.*
Handle dc:identifier
https://hdl.handle.net/2142/129517

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Emeka, Chinedu Alexander. Understanding and improving students’ testing experiences in large-scale computer science and other STEM courses. Dissertation thesis, University of Illinois Urbana-Champaign, 2025. https://hdl.handle.net/2142/129517