University of Illinois at Urbana-Champaign
Interfacial adhesion of thin film high energy density anode materials
Abstract
dc:descriptionFuture energy storage needs are rapidly moving beyond the capabilities of current Li-ion battery technologies. The demand for greater energy density, performance, and longevity has led to the development of numerous three-dimensional (3D) structured anodes that can leverage the incredible Li storage capacity of silicon. A common feature among many 3D structured anodes is the use of a nickel (Ni) current collector scaffold coated with amorphous silicon (a-Si) active material. Despite the importance of a-Si remaining adhered to the Ni scaffold during cycling, little work has been done to study the interface strength of Ni/a-Si systems. Here, we investigate Ni/a-Si interfacial adhesion strength through the technique of laser spallation (LS) combined with finite element analysis (FEA). It was found that the Ni/a-Si interface can withstand at least ~250 MPa in tension before failure is initiated. Tests at higher stress levels were inconclusive due to consistent failure of the sample at the substrate/a-Si interface rather than the Ni/a-Si interface. Results also showed that the adhesion strength of Ni/a-Si was much weaker when a-Si was deposited by chemical vapor deposition (CVD) rather than electron-beam (e-beam) evaporation. This study brings insight to the durability Ni/a-Si structured anodes and will prove valuable in the design of future battery technologies.
Degree
thesis:*- Name thesis:degree_name
- M.S.
- Level thesis:degree_level
- Thesis
- Discipline thesis:degree_discipline
- Materials Science and Engineering
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2021
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Diamond, Jacob M.
- Contributors dc:contributor
-
- Sottos, Nancy R.
Subjects
dc:subject × 4Rights
dc:rights- Statement dc:rights
-
- Copyright 2020 Jacob Diamond
- Language dc:language
- en
Identifiers
dc:identifier.*- Handle dc:identifier
- http://hdl.handle.net/2142/109483
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/109483