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Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 20 of 82 for “"Process variation"”.
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Timing Analysis and Behavioral Synthesis with Process Variation
The move to deep submicron processes has brought about new problems that designers must contend with in order to obtain functional circuits. Process variation has been recognized as one of the leading issues that must be dealt with in deep submicron processes. The problems experienced with deep …
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Investigation into voltage and process variation-aware manufacturing test
… manufacturing testing. This thesis studies how process and supply voltage variation influence defect behaviour to determine the impact on manufacturing test cost and quality. The focus is on logic testing of static CMOS designs with respect to two important defect types in deep submicron CMOS: …
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Study of CMOS process variation by multiplexing analog characteristics
… methods to characterize and model circuit variation at both the front and back end of line, where critical parameters such as threshold voltage and parasitic capacitance must be carefully modeled for accurate circuit performance. This thesis addresses this need by contributing a test …
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Modeling the effects of systematic process variation of circuit performance
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2001.
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Characterization and mitigation of process variation in digital circuits and systems
Process variation threatens to negate a whole generation of scaling in advanced process technologies due to performance and power spreads of greater than 30-50%. Mitigating this impact requires a thorough understanding of the variation sources, magnitudes and spatial components at the device, …
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Addressing process variation in aerosol jet printing and accelerating conformal electronics manufacturing
… production environments due to problems with process variability and drift. Manufacturing tolerances expected with incumbent electronics fabrication technologies are difficult to hit and quality control tools are lacking. Additionally, while AJP is well-suited for conformal electronics …
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Adjoint Methods and Inverse Modeling for Process Variation Analysis in Silicon Photonics
… the field of integrated photonics, manufacturing process variation studies are required to launch the many photonic applications to mass production and commercial use. Specifically, we need models that predict the impact of process variations on photonic circuits, and extraction of process …
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Pattern recognition for manufacturing process variation using integrated statistical process control – artificial neural network
Variation in manufacturing process is known to be a major source of poor quality products and variation control is essential in quality improvement. In bivariate cases, which involve two correlated quality variables, the traditional statistical process control (SPC) charts are known to be effective …
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Evaluating the effect of process variation on silicon and graphene nano-ribbon based circuits
Item withdrawn by Mark Zulauf (zulauf@illinois.edu) on 2012-04-21T15:49:15Z Item was in collections: University of Illinois Theses & Dissertations (ID: 1) No. of bitstreams: 2 Rogachev_Artem.docx: 719809 bytes, checksum: a5e99a79e062ca8794a0646df6052ac8 (MD5) Rogachev_Artem.pdf: 1216501 bytes, …
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Study of artificial neural network scheme application in manufacturing industry for monitoring-diagnosis bivariate process variation
In manufacturing industries, process variation is known to be a major source of poor quality. As such, process monitoring and diagnosis is critical towards continuous quality improvement. This becomes more challenging when involving two or more correlated variables (multivariate). Process …
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Synergistic artificial neural network scheme for monitoring and diagnosis of multivariate process variation in mean shifts
… Monitoring refers to the identification of process condition either it is running in control or out of control. Diagnosis refers to the identification of source variables (X1 and X2) for out of control. In this study, a synergistic artificial neural network scheme was investigated in quality …
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Flip chip attachment methods : a methodology for evaluating the effects of supplier process variation and supplier relationships on product reliability
Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management; and, Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1998.
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Design for manufacturability with regular fabrics in digital integrated circuits
… As devices scale down, sensitivity to process variation increases dramatically, making design for manufacturability a critical concern. Designers must identify the designs that generate the least systematic process variation, e.g., from pattern dependent effects, but must also build …
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A sub-threshold cell library and methodology
… secondary concern, but increased sensitivity to process variation must be mitigated in this regime. With scaling of process technologies, random within-die variation has recently introduced another degree of complexity in circuit design. This thesis proposes approaches to mitigate process …
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A Statistical and Circuit Based Technique for Counterfeit Detection in Existing ICs
… the age, as it is also greatly influenced by process variation and this could result in large error in classifying ICs as authentic or counterfeit. �Instead, we establish that the relationship between the delays of two or more paths is a great indicator for the age of device. The idea is to …
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Multilayer Techniques to Address Parameter Variation
Within-die process variation causes individual cores in a Chip Multiprocessor (CMP) to differ substantially in both static power consumed and maximum frequency supported. In this environment, ignoring variation effects when scheduling applications or when managing power with Dynamic Voltage and …
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Tecniche di progettazione tollerante alle variazioni per circuiti digitali in tecnologie nanometriche
… approaching the nanometer size. The lithographic process in the manufacturing stage is increasing its uncertainty with the scaling down of the transistors size, resulting in a larger parameter variation in future technology generations. Furthermore, the exponential relationship between the leakage …
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Manufacturing Process Design and Control Based on Error Equivalence Methodology
… error sources result in identical deviation and variation patterns on part features. This could have dual effects on process variation reduction: it significantly increases the complexity of root cause diagnosis in process control, and provides an opportunity to use one error source as based …
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Power and energy management of modern architectures in adaptive HPC runtime systems
… utilization of accelerator devices and process variation. To study accelerators, we analyze and optimize an example application on a heterogeneous architecture and demonstrate techniques for efficient mapping on different devices (CPU and GPU). To address process variation challenges, we …
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