A sub-threshold cell library and methodology

Sub-threshold operation is a compelling approach for energy-constrained applications where speed is of secondary concern, but increased sensitivity to process variation must be mitigated in this regime. With scaling of process technologies, random within-die variation has recently introduced another degree of complexity in circuit design. This thesis proposes approaches to mitigate process variation in sub-threshold circuits through device sizing, topology selection and fault-tolerant architecture. This thesis makes several contributions to a sub-threshold circuit design methodology. A formal analysis of device sizing trade-offs between delay, energy, and variability reveals that while minimum size devices provide lowest energy and delay in sub-threshold, their increased sensitivity to random dopant fluctuation may cause functional errors. A proposed variation-driven design approach enables consistent sizing of logic gates and registers for constant functional yield. A yield constraint imposes energy overhead at low power supply voltages and changes the minimum energy operating point of a circuit.

Department dc:contributor.department

Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2006

Author dc:creator

• Kwong, Joyce Y. S. (Joyce Yui Si)

Advisor dc:contributor.advisor

• Anantha P. Chandrakasan.

• Electrical Engineering and Computer Science.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/37947

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/37947