West Virginia University
Estimating reliability impact of biometric devices in large scale applications
Abstract
dc:description.abstractIn the last two decades, there has been a tremendous growth of biometric applications especially in security. Reliability of the biometric devices is extremely important.;This thesis discusses an approach for estimating the reliability of systems, which contain biometric user authentication subsystem. The ECRA (Early Component Based Reliability Assessment) tool utilizes an easy to use interface and employs the Bayesian algorithm to predict the system reliability. This application of the ECRA technique to biometrics is new. Using the UML diagrams and the ECRA tool, the reliability of the system is predicted.
Degree
thesis:*- Name thesis:degree_name
- MS
- Level thesis:degree_level
- Thesis
- Discipline thesis:degree_discipline
- Lane Department of Computer Science and Electrical Engineering
- Year dc:date.available
- 2003
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Mahadevan, Karthikeyan
- Contributors dc:contributor
-
- Bojan Cukic.
Subjects
dc:subject × 2Identifiers
dc:identifier.*- Identifier
- https://researchrepository.wvu.edu/etd/1352
- OAI identifier oai:identifier
- oai:researchrepository.wvu.edu:etd-2355