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West Virginia University

Estimating reliability impact of biometric devices in large scale applications

Abstract

dc:description.abstract

In the last two decades, there has been a tremendous growth of biometric applications especially in security. Reliability of the biometric devices is extremely important.;This thesis discusses an approach for estimating the reliability of systems, which contain biometric user authentication subsystem. The ECRA (Early Component Based Reliability Assessment) tool utilizes an easy to use interface and employs the Bayesian algorithm to predict the system reliability. This application of the ECRA technique to biometrics is new. Using the UML diagrams and the ECRA tool, the reliability of the system is predicted.

Degree

thesis:*
Name thesis:degree_name
MS
Level thesis:degree_level
Thesis
Discipline thesis:degree_discipline
Lane Department of Computer Science and Electrical Engineering
Year dc:date.available
2003

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Mahadevan, Karthikeyan
Contributors dc:contributor
  • Bojan Cukic.

Subjects

dc:subject × 2

Identifiers

dc:identifier.*
OAI identifier oai:identifier
oai:researchrepository.wvu.edu:etd-2355

Chain of custody

source
Harvested from
West Virginia University
Base URL
researchrepository.wvu.edu/do/oai/
Last updated
2026-07-24
Source record
OAI-PMH GetRecord
citation

Mahadevan, Karthikeyan. Estimating reliability impact of biometric devices in large scale applications. Thesis thesis, 2003. https://doi.org/10.33915/etd.1352