{"id":{"repo_id":"wvu","oai_identifier":"oai:researchrepository.wvu.edu:etd-2355"},"canonical_url":"https://search.dev.ndltd.org/etd/wvu/oai:researchrepository.wvu.edu:etd-2355","repository":{"repo_id":"wvu","name":"West Virginia University","base_url":"https://researchrepository.wvu.edu/do/oai/"},"display":{"title":"Estimating reliability impact of biometric devices in large scale applications","abstract":"In the last two decades, there has been a tremendous growth of biometric applications especially in security. Reliability of the biometric devices is extremely important.;This thesis discusses an approach for estimating the reliability of systems, which contain biometric user authentication subsystem. The ECRA (Early Component Based Reliability Assessment) tool utilizes an easy to use interface and employs the Bayesian algorithm to predict the system reliability. This application of the ECRA technique to biometrics is new. 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