A methodology for self-testing microprocessors

Procedures for designing and writing a CPU self-test program are developed for microprocessors in general. Specific examples of these procedures are then provided for both a simple example processor and for the Intel 8080; fault coverage statistics are provided for the 8080 test. The self-test methodology overlaps the tests for different elements within the CPU in order to attain a very quick test suitable for periodic background testing. Generalized fault classes are defined for the CPU and methods for sensitizing and detecting these faults are detailed. General procedures and hardware requirements for self-testing the entire microcomputer system within its operating environment are discussed. Fault simulation techniques are also discussed; simulation provides feedback on the effectiveness of a self-test and allows the test to be improved for better coverage and faster execution.

Name thesis:degree_name

Master of Science

Level thesis:degree_level

masters

Discipline thesis:degree_discipline

Electrical Engineering

Department dc:contributor.department

Electrical Engineering

Grantor dc:publisher

Virginia Polytechnic Institute and State University

Year dc:date.issued

1982

Author dc:creator

• Haislett, David W.

Statement dc:rights

• In Copyright

Licence dc:rights.uri

• http://rightsstatements.org/vocab/InC/1.0/

Language dc:language.iso

en_US

Handle dc:identifier.uri

http://hdl.handle.net/10919/74474

OAI identifier oai:identifier

oai:vtechworks.lib.vt.edu:10919/74474