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Virginia Tech

On improving parallel pattern single fault propagation for synchronous sequential circuits

Abstract

dc:description.abstract

The parallel pattern single fault propagation (PPSFP) method is known to be the most efficient for fault simulation of combinational circuits. Recently, PPSFP has been extended to synchronous sequential circuits [1]. The fault simulator called PARIS is the unique sequential circuit fault simulator based on PPSFP. In this thesis, four new heuristics are proposed to enhance the speed of PARIS. The four heuristics are: 1. Immediate fault dropping after every iteration, 2. Filler bit simulation at the first packet 3. Look-ahead of initial states, and 4. Single bit correction for flip-flop evaluation. The four heuristics have been implemented separately, and the performance of the heuristics were measured. According to our results, the four heuristics improve the speed of most benchmark circuits. The four heuristics are integrated into a fault simulator, which we call VISION. The speed of VISION is, on an average, 1.3 times faster than PARIS for the benchmark circuits.

Degree

thesis:*
Name thesis:degree_name
Master of Science
Level thesis:degree_level
masters
Discipline thesis:degree_discipline
Electrical Engineering
Department dc:contributor.department
Electrical Engineering
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
1994

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Nair, Rajesh

Rights

dc:rights
Statement dc:rights
  • In Copyright
Language dc:language.iso
en

Identifiers

dc:identifier.*
Dc Identifier Other
etd-06302009-040508
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/43511

Chain of custody

source
Harvested from
Virginia Tech
Base URL
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Last updated
2026-07-22
Source record
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related terms
citation

Nair, Rajesh. On improving parallel pattern single fault propagation for synchronous sequential circuits. masters thesis, Virginia Tech, 1994. http://hdl.handle.net/10919/43511