Analysis of single event transients in arbitrary waveforms using statistical window analysis

Window functions are commonly used in data processing to detect transient events or for time-averaging of frequency spectra. A generalized window function is demonstrated using the Ionizing Radiation Effects Spectroscopy (IRES) technique to enhance the measurement of transient anomalies within arbitrary waveforms. The IRES filter convolves time data with a sliding window consisting of a moment-generating function. The resulting time-dependent statistical moments are used to eliminate any steady-state signatures, including noise, and extract transient behaviors. The IRES filter analyzes data from heavy-ion exposures of commercial off-the-shelf (COTS) operational amplifiers, laser-induced transients in Complementary Metal-Oxide-Semiconductor (CMOS) phase-locked loops, and simulated transients in digital and analog circuits.The performance of the IRES filter in noisy environments shows that transients can be measured with higher fidelity than standard amplitude thresholding. This statistical window analysis technique may remove the need for complex triggering mechanisms on instrumentation and doesn’t require a-prior knowledge of transient characteristics.

Grantor dc:publisher

University of Tennessee at Chattanooga

Author dc:creator

• Carpenter, James

Contributors dc:contributor

• Loveless, Thomas Daniel
• Ahmed, Raga; Reising, Donald R.
• College of Engineering and Computer Science

• Ionizing radiation--Measurement
• Materials--Effect of radiation on

Licence

• http://rightsstatements.org/vocab/InC/1.0/

Language dc:language

English, eng

Repository record dc:identifier

https://scholar.utc.edu/theses/851

OAI identifier oai:identifier

oai:scholar.utc.edu:theses-2029