{"id":{"repo_id":"utc","oai_identifier":"oai:scholar.utc.edu:theses-2029"},"canonical_url":"https://search.dev.ndltd.org/etd/utc/oai:scholar.utc.edu:theses-2029","repository":{"repo_id":"utc","name":"University of Tennessee - Chattanooga","base_url":"https://scholar.utc.edu/do/oai/"},"display":{"title":"Analysis of single event transients in arbitrary waveforms using statistical window analysis","abstract":"Window functions are commonly used in data processing to detect transient events or for time-averaging of frequency spectra. A generalized window function is demonstrated using the Ionizing Radiation Effects Spectroscopy (IRES) technique to enhance the measurement of transient anomalies within arbitrary waveforms. The IRES filter convolves time data with a sliding window consisting of a moment-generating function. The resulting time-dependent statistical moments are used to eliminate any steady-state signatures, including noise, and extract transient behaviors. The IRES filter analyzes data from heavy-ion exposures of commercial off-the-shelf (COTS) operational amplifiers, laser-induced transients in Complementary Metal-Oxide-Semiconductor (CMOS) phase-locked loops, and simulated transients in digital and analog circuits.The performance of the IRES filter in noisy environments shows that transients can be measured with higher fidelity than standard amplitude thresholding. This statistical window analysis technique may remove the need for complex triggering mechanisms on instrumentation and doesn’t require a-prior knowledge of transient characteristics.","abstract_html":"Window functions are commonly used in data processing to detect transient events or for time-averaging of frequency spectra. A generalized window function is demonstrated using the Ionizing Radiation Effects Spectroscopy (IRES) technique to enhance the measurement of transient anomalies within arbitrary waveforms. The IRES filter convolves time data with a sliding window consisting of a moment-generating function. The resulting time-dependent statistical moments are used to eliminate any steady-state signatures, including noise, and extract transient behaviors. The IRES filter analyzes data from heavy-ion exposures of commercial off-the-shelf (COTS) operational amplifiers, laser-induced transients in Complementary Metal-Oxide-Semiconductor (CMOS) phase-locked loops, and simulated transients in digital and analog circuits.The performance of the IRES filter in noisy environments shows that transients can be measured with higher fidelity than standard amplitude thresholding. This statistical window analysis technique may remove the need for complex triggering mechanisms on instrumentation and doesn’t require a-prior knowledge of transient characteristics.","abstract_has_math":false,"creators":["Carpenter, James"],"institution":"University of Tennessee at Chattanooga","degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":null,"school":null,"contributors":["Loveless, Thomas Daniel","Ahmed, Raga; Reising, Donald R.","College of Engineering and Computer Science"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":null,"date_issued":"","date_published":null,"updated_at":"2026-07-24T05:47:13Z","subjects":["Ionizing radiation--Measurement","Materials--Effect of radiation on"],"languages":["English","eng"],"rights":[],"rights_urls":["http://rightsstatements.org/vocab/InC/1.0/"],"identifier_entries":[]},"links":{"outbound_url":"https://scholar.utc.edu/theses/851","outbound_label":"Repository record","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Loveless, Thomas Daniel","Ahmed, Raga; Reising, Donald R.","College of Engineering and Computer Science"]},{"key":"dc:creator","label":"Author","values":["Carpenter, James"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2024-05-01T07:00:00Z"]},{"key":"dc:publisher","label":"Institution","values":["University of Tennessee at Chattanooga","Chattanooga (Tenn.)"]},{"key":"dc:relation","label":"Dc Relation","values":["Masters Theses and Doctoral Dissertations"]},{"key":"dc:type","label":"Dc Type","values":["Masters theses","Text"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Ionizing radiation--Measurement","Materials--Effect of radiation on"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["English","eng"]},{"key":"dc:rights","label":"Dc Rights","values":["http://rightsstatements.org/vocab/InC/1.0/"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["https://scholar.utc.edu/theses/851"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Dept. of Electrical Engineering","M. S.; A thesis submitted to the faculty of the University of Tennessee at Chattanooga in partial fulfillment of the requirements of the degree of Master of Science."]},{"key":"dc:description.abstract","label":"Abstract","values":["Window functions are commonly used in data processing to detect transient events or for time-averaging of frequency spectra. A generalized window function is demonstrated using the Ionizing Radiation Effects Spectroscopy (IRES) technique to enhance the measurement of transient anomalies within arbitrary waveforms. The IRES filter convolves time data with a sliding window consisting of a moment-generating function. The resulting time-dependent statistical moments are used to eliminate any steady-state signatures, including noise, and extract transient behaviors. The IRES filter analyzes data from heavy-ion exposures of commercial off-the-shelf (COTS) operational amplifiers, laser-induced transients in Complementary Metal-Oxide-Semiconductor (CMOS) phase-locked loops, and simulated transients in digital and analog circuits.The performance of the IRES filter in noisy environments shows that transients can be measured with higher fidelity than standard amplitude thresholding. This statistical window analysis technique may remove the need for complex triggering mechanisms on instrumentation and doesn’t require a-prior knowledge of transient characteristics."]},{"key":"dc:title","label":"Title","values":["Analysis of single event transients in arbitrary waveforms using statistical window analysis"]}]}],"canonical_facts":{"dc:contributor":["Loveless, Thomas Daniel","Ahmed, Raga; Reising, Donald R.","College of Engineering and Computer Science"],"dc:creator":["Carpenter, James"],"dc:date":["2024-05-01T07:00:00Z"],"dc:description":["Dept. of Electrical Engineering","M. S.; A thesis submitted to the faculty of the University of Tennessee at Chattanooga in partial fulfillment of the requirements of the degree of Master of Science."],"dc:description.abstract":["Window functions are commonly used in data processing to detect transient events or for time-averaging of frequency spectra. A generalized window function is demonstrated using the Ionizing Radiation Effects Spectroscopy (IRES) technique to enhance the measurement of transient anomalies within arbitrary waveforms. The IRES filter convolves time data with a sliding window consisting of a moment-generating function. The resulting time-dependent statistical moments are used to eliminate any steady-state signatures, including noise, and extract transient behaviors. The IRES filter analyzes data from heavy-ion exposures of commercial off-the-shelf (COTS) operational amplifiers, laser-induced transients in Complementary Metal-Oxide-Semiconductor (CMOS) phase-locked loops, and simulated transients in digital and analog circuits.The performance of the IRES filter in noisy environments shows that transients can be measured with higher fidelity than standard amplitude thresholding. This statistical window analysis technique may remove the need for complex triggering mechanisms on instrumentation and doesn’t require a-prior knowledge of transient characteristics."],"dc:identifier":["https://scholar.utc.edu/theses/851"],"dc:language":["English","eng"],"dc:publisher":["University of Tennessee at Chattanooga","Chattanooga (Tenn.)"],"dc:relation":["Masters Theses and Doctoral Dissertations"],"dc:rights":["http://rightsstatements.org/vocab/InC/1.0/"],"dc:subject":["Ionizing radiation--Measurement","Materials--Effect of radiation on"],"dc:title":["Analysis of single event transients in arbitrary waveforms using statistical window analysis"],"dc:type":["Masters theses","Text"]},"updated_at":"2026-07-24T05:47:13Z"}