Abstract
dc:description.abstractThe reliability of microelectronics operating in harsh environments is a concern for space systems. Various stresses, such as exposure to ionizing radiation and extreme temperatures can result in performance degradation, transient anomalies, and hard failures. These issues have become evident in recent years with the increasing interest in the use of commercial-off-the-shelf (COTS) electronics in space systems. While COTS parts offer maximum performance, their use results in unavoidable increases in risk. This work presents a noninvasive technique for the measurement of cumulative and transient radiation effects in arbitrary circuits, termed ionizing radiation effects spectroscopy (IRES). IRES identifies radiation effects based on statistical time-frequency analyses of native waveform behavior, thus having a minimal impact on operating performance. The resulting measures are used to identify parametric shifts as well as transient anomalies. IRES, which exploits the subtle characteristics inherent in the waveforms, shows promise for in-situ health monitoring and radiation mitigation.
Degree
thesis:*- Grantor dc:publisher
- University of Tennessee at Chattanooga
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Patel, Bharat
- Contributors dc:contributor
-
- Loveless, T. Daniel
- Ofoli, Abdul R.; Reising, Donald R.
- College of Engineering and Computer Science
Subjects
dc:subject × 3Rights
dc:rights- Language dc:language
- English, eng
Identifiers
dc:identifier.*- Repository record dc:identifier
- https://scholar.utc.edu/theses/630
- OAI identifier oai:identifier
- oai:scholar.utc.edu:theses-1788