{"id":{"repo_id":"utc","oai_identifier":"oai:scholar.utc.edu:theses-1788"},"canonical_url":"https://search.dev.ndltd.org/etd/utc/oai:scholar.utc.edu:theses-1788","repository":{"repo_id":"utc","name":"University of Tennessee - Chattanooga","base_url":"https://scholar.utc.edu/do/oai/"},"display":{"title":"Ionizing radiation effects spectroscopy","abstract":"The reliability of microelectronics operating in harsh environments is a concern for space systems. Various stresses, such as exposure to ionizing radiation and extreme temperatures can result in performance degradation, transient anomalies, and hard failures. These issues have become evident in recent years with the increasing interest in the use of commercial-off-the-shelf (COTS) electronics in space systems. While COTS parts offer maximum performance, their use results in unavoidable increases in risk. This work presents a noninvasive technique for the measurement of cumulative and transient radiation effects in arbitrary circuits, termed ionizing radiation effects spectroscopy (IRES). IRES identifies radiation effects based on statistical time-frequency analyses of native waveform behavior, thus having a minimal impact on operating performance. The resulting measures are used to identify parametric shifts as well as transient anomalies. IRES, which exploits the subtle characteristics inherent in the waveforms, shows promise for in-situ health monitoring and radiation mitigation.","abstract_html":"The reliability of microelectronics operating in harsh environments is a concern for space systems. Various stresses, such as exposure to ionizing radiation and extreme temperatures can result in performance degradation, transient anomalies, and hard failures. These issues have become evident in recent years with the increasing interest in the use of commercial-off-the-shelf (COTS) electronics in space systems. While COTS parts offer maximum performance, their use results in unavoidable increases in risk. This work presents a noninvasive technique for the measurement of cumulative and transient radiation effects in arbitrary circuits, termed ionizing radiation effects spectroscopy (IRES). IRES identifies radiation effects based on statistical time-frequency analyses of native waveform behavior, thus having a minimal impact on operating performance. The resulting measures are used to identify parametric shifts as well as transient anomalies. IRES, which exploits the subtle characteristics inherent in the waveforms, shows promise for in-situ health monitoring and radiation mitigation.","abstract_has_math":false,"creators":["Patel, Bharat"],"institution":"University of Tennessee at Chattanooga","degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":null,"school":null,"contributors":["Loveless, T. Daniel","Ofoli, Abdul R.; Reising, Donald R.","College of Engineering and Computer Science"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":null,"date_issued":"","date_published":null,"updated_at":"2026-07-24T05:46:59Z","subjects":["Materials -- Effect of radiation on","Atmospheric radiation","Radiation -- Measurement"],"languages":["English","eng"],"rights":[],"rights_urls":["https://rightsstatements.org/page/InC/1.0/?language=en"],"identifier_entries":[]},"links":{"outbound_url":"https://scholar.utc.edu/theses/630","outbound_label":"Repository record","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Loveless, T. Daniel","Ofoli, Abdul R.; Reising, Donald R.","College of Engineering and Computer Science"]},{"key":"dc:creator","label":"Author","values":["Patel, Bharat"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date","label":"Dc Date","values":["2019-12-01T08:00:00Z"]},{"key":"dc:publisher","label":"Institution","values":["University of Tennessee at Chattanooga","Chattanooga (Tenn.)"]},{"key":"dc:relation","label":"Dc Relation","values":["Masters Theses and Doctoral Dissertations"]},{"key":"dc:type","label":"Dc Type","values":["Masters theses","Text"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Materials -- Effect of radiation on","Atmospheric radiation","Radiation -- Measurement"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["English","eng"]},{"key":"dc:rights","label":"Dc Rights","values":["https://rightsstatements.org/page/InC/1.0/?language=en"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["https://scholar.utc.edu/theses/630"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Dept. of Electrical Engineering","M. S.; A thesis submitted to the faculty of the University of Tennessee at Chattanooga in partial fulfillment of the requirements of the degree of Master of Science."]},{"key":"dc:description.abstract","label":"Abstract","values":["The reliability of microelectronics operating in harsh environments is a concern for space systems. Various stresses, such as exposure to ionizing radiation and extreme temperatures can result in performance degradation, transient anomalies, and hard failures. These issues have become evident in recent years with the increasing interest in the use of commercial-off-the-shelf (COTS) electronics in space systems. While COTS parts offer maximum performance, their use results in unavoidable increases in risk. This work presents a noninvasive technique for the measurement of cumulative and transient radiation effects in arbitrary circuits, termed ionizing radiation effects spectroscopy (IRES). IRES identifies radiation effects based on statistical time-frequency analyses of native waveform behavior, thus having a minimal impact on operating performance. The resulting measures are used to identify parametric shifts as well as transient anomalies. IRES, which exploits the subtle characteristics inherent in the waveforms, shows promise for in-situ health monitoring and radiation mitigation."]},{"key":"dc:title","label":"Title","values":["Ionizing radiation effects spectroscopy"]}]}],"canonical_facts":{"dc:contributor":["Loveless, T. Daniel","Ofoli, Abdul R.; Reising, Donald R.","College of Engineering and Computer Science"],"dc:creator":["Patel, Bharat"],"dc:date":["2019-12-01T08:00:00Z"],"dc:description":["Dept. of Electrical Engineering","M. S.; A thesis submitted to the faculty of the University of Tennessee at Chattanooga in partial fulfillment of the requirements of the degree of Master of Science."],"dc:description.abstract":["The reliability of microelectronics operating in harsh environments is a concern for space systems. Various stresses, such as exposure to ionizing radiation and extreme temperatures can result in performance degradation, transient anomalies, and hard failures. These issues have become evident in recent years with the increasing interest in the use of commercial-off-the-shelf (COTS) electronics in space systems. While COTS parts offer maximum performance, their use results in unavoidable increases in risk. This work presents a noninvasive technique for the measurement of cumulative and transient radiation effects in arbitrary circuits, termed ionizing radiation effects spectroscopy (IRES). IRES identifies radiation effects based on statistical time-frequency analyses of native waveform behavior, thus having a minimal impact on operating performance. The resulting measures are used to identify parametric shifts as well as transient anomalies. IRES, which exploits the subtle characteristics inherent in the waveforms, shows promise for in-situ health monitoring and radiation mitigation."],"dc:identifier":["https://scholar.utc.edu/theses/630"],"dc:language":["English","eng"],"dc:publisher":["University of Tennessee at Chattanooga","Chattanooga (Tenn.)"],"dc:relation":["Masters Theses and Doctoral Dissertations"],"dc:rights":["https://rightsstatements.org/page/InC/1.0/?language=en"],"dc:subject":["Materials -- Effect of radiation on","Atmospheric radiation","Radiation -- Measurement"],"dc:title":["Ionizing radiation effects spectroscopy"],"dc:type":["Masters theses","Text"]},"updated_at":"2026-07-24T05:46:59Z"}