Energy Distribution of Sputtered Neutral Atoms from a Multilayer Target

Energy distribution measurements of sputtered neutral particles contribute to the general knowledge of sputtering, a common technique for surface analysis. In this work emphasis was placed on the measurement of energy distribution of sputtered neutral atoms from different depths. The liquid Ga-In eutectic alloy as a sample target for this study was ideal due to an extreme concentration ratio gradient between the top two monolayers. In pursuing this study, the method of sputter-initiated resonance ionization spectroscopy (SIRIS) was utilized. SIRIS employs a pulsed ion beam to initiate sputtering and tunable dye lasers for resonance ionization. Observation of the energy distribution was achieved with a position-sensitive detector. The principle behind the detector's energy resolution is time of flight (TOF) spectroscopy. For this specific detector, programmed time intervals between the sputtering pulse at the target and the ionizing laser pulse provided information leading to the energy distribution of the secondary neutral particles. This experiment contributes data for energy distributions of sputtered neutral particles to the experimental database, required by theoretical models and computer simulations for the sputtering phenomenon.

Grantor dc:publisher

University of North Texas

Year dc:date

2000

Author dc:creator

• Bigelow, Alan W.

Contributors dc:contributor

• Weathers, Duncan L.
• Matteson, Samuel E.
• Duggan, Jerome L.
• McDaniel, Floyd D.

• Surfaces (Technology) -- Analysis.
• Sputtering (Physics)
• surface analysis
• sputtering
• energy distribution
• position-sensitive detector
• SIRIS

Statement dc:rights

• Public
• Copyright
• Bigelow, Alan W.
• Copyright is held by the author, unless otherwise noted. All rights reserved.

Language dc:language

English

Identifier

oclc: 47284123
https://digital.library.unt.edu/ark:/67531/metadc2657/
ark: ark:/67531/metadc2657

OAI identifier oai:identifier

info:ark/67531/metadc2657