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University of New Mexico
An Optoelectronic Detector Circuit for Measuring Ultra-Small Angular Deflections
Abstract
dc:description.abstractThe thesis problem was to design, construct, test and evaluate an opto-electronic detector subsystem for use in the Small Angle Measurement Device (SAMD) system. The SAMD measures the ultra-small angular deflection (bending) of the substrate to which it is attached.
Degree
thesis:*- Name thesis:degree_name
- Electrical Engineering
- Level thesis:degree_level
- Thesis
- Discipline thesis:degree_discipline
- Electrical and Computer Engineering
- Year
- 2012
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Tuttle, John Randall
- Contributors dc:contributor
-
- Karni
- Jamshad
- Hawkins
Rights
- Language dc:language
- English
Identifiers
dc:identifier.*- Repository record dc:identifier
- https://digitalrepository.unm.edu/ece_etds/254
- OAI identifier oai:identifier
- oai:digitalrepository.unm.edu:ece_etds-1253