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University of New Mexico

An Optoelectronic Detector Circuit for Measuring Ultra-Small Angular Deflections

Abstract

dc:description.abstract

The thesis problem was to design, construct, test and evaluate an opto-electronic detector subsystem for use in the Small Angle Measurement Device (SAMD) system. The SAMD measures the ultra-small angular deflection (bending) of the substrate to which it is attached.

Degree

thesis:*
Name thesis:degree_name
Electrical Engineering
Level thesis:degree_level
Thesis
Discipline thesis:degree_discipline
Electrical and Computer Engineering
Year
2012

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Tuttle, John Randall
Contributors dc:contributor
  • Karni
  • Jamshad
  • Hawkins

Rights

Language dc:language
English

Identifiers

dc:identifier.*
Repository record dc:identifier
https://digitalrepository.unm.edu/ece_etds/254
OAI identifier oai:identifier
oai:digitalrepository.unm.edu:ece_etds-1253

Chain of custody

source
Harvested from
University of New Mexico
Base URL
digitalrepository.unm.edu/do/oai/
Last updated
2026-07-24
Source record
OAI-PMH GetRecord
related terms
citation

Tuttle, John Randall. An Optoelectronic Detector Circuit for Measuring Ultra-Small Angular Deflections. Thesis thesis, 2012. https://digitalrepository.unm.edu/ece_etds/254