{"id":{"repo_id":"unm","oai_identifier":"oai:digitalrepository.unm.edu:ece_etds-1253"},"canonical_url":"https://search.dev.ndltd.org/etd/unm/oai:digitalrepository.unm.edu:ece_etds-1253","repository":{"repo_id":"unm","name":"University of New Mexico","base_url":"https://digitalrepository.unm.edu/do/oai/"},"display":{"title":"An Optoelectronic Detector Circuit for Measuring Ultra-Small Angular Deflections","abstract":"The thesis problem was to design, construct, test and evaluate an opto-electronic detector subsystem for use in the Small Angle Measurement Device (SAMD) system. The SAMD measures the ultra-small angular deflection (bending) of the substrate to which it is attached.","abstract_html":"The thesis problem was to design, construct, test and evaluate an opto-electronic detector subsystem for use in the Small Angle Measurement Device (SAMD) system. The SAMD measures the ultra-small angular deflection (bending) of the substrate to which it is attached.","abstract_has_math":false,"creators":["Tuttle, John Randall"],"institution":null,"degree_name":"Electrical Engineering","degree_level":"Thesis","degree_discipline":"Electrical and Computer Engineering","degree_department":null,"school":null,"contributors":["Karni","Jamshad","Hawkins"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2012,"date_issued":"2012-11-30T08:00:00Z","date_published":"2012-11-30T08:00:00Z","updated_at":"2026-07-24T05:27:25Z","subjects":[],"languages":["English"],"rights":[],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"https://digitalrepository.unm.edu/ece_etds/254","outbound_label":"Repository record","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Karni","Jamshad","Hawkins"]},{"key":"dc:creator","label":"Author","values":["Tuttle, John Randall"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"thesis:degree_discipline","label":"Discipline","values":["Electrical and Computer Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Thesis","Masters"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Electrical Engineering"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["English"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["https://digitalrepository.unm.edu/ece_etds/254"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["The thesis problem was to design, construct, test and evaluate an opto-electronic detector subsystem for use in the Small Angle Measurement Device (SAMD) system. The SAMD measures the ultra-small angular deflection (bending) of the substrate to which it is attached."]},{"key":"dc:title","label":"Title","values":["An Optoelectronic Detector Circuit for Measuring Ultra-Small Angular Deflections"]}]}],"canonical_facts":{"dc:contributor":["Karni","Jamshad","Hawkins"],"dc:creator":["Tuttle, John Randall"],"dc:description.abstract":["The thesis problem was to design, construct, test and evaluate an opto-electronic detector subsystem for use in the Small Angle Measurement Device (SAMD) system. The SAMD measures the ultra-small angular deflection (bending) of the substrate to which it is attached."],"dc:identifier":["https://digitalrepository.unm.edu/ece_etds/254"],"dc:language":["English"],"dc:title":["An Optoelectronic Detector Circuit for Measuring Ultra-Small Angular Deflections"],"thesis:degree_discipline":["Electrical and Computer Engineering"],"thesis:degree_level":["Thesis","Masters"],"thesis:degree_name":["Electrical Engineering"]},"updated_at":"2026-07-24T05:27:25Z"}