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University of Illinois at Urbana-Champaign

Multi-scale investigation of vacancy-mediated diffusion of Si in Ni near an edge dislocation

Abstract

dc:description

During the last decade, studies have focused the development of creep-resistant alloys that can tolerate the high temperatures and high irradiation doses within nuclear reactors. One important mechanism of irradiation creep is the migration of dislocations, which arises as a direct consequence of point-defect diffusion near dislocations and is also affected by the presence of solutes. In this work, we develop a multi-scale model which is able to simulate the diffusion of point-defects and solute atoms in the dislocation strain field. We first use kinetic Monte Carlo simulations to investigate the strain effects on the transport coefficients for vacancies and Si in FCC Ni. We then use a mesoscale model, which takes the strain-dependent transport coefficient computed by self-consistent mean field calculations, to model the irradiation induced solute segregation around an $\frac{a}{2}[1\bar{1}0](111)$ edge dislocation in FCC Ni-Si alloy. At last, we extend the mesoscale model into an multi-scale approach by coupling it to a discrete model which captures the thermally activated atomic transitions and reactions in the dislocation core. We use the multi-scale approach to investigate the climb motion of an $\frac{a}{2}[1\bar{1}0](111)$ edge dislocation in FCC Ni-Si alloy, induced by irradiation and by an externally applied stress. We also quantify the effect of solute on the climb velocity.

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Nuclear, Plasma, Radiolgc Engr
Grantor
University of Illinois at Urbana-Champaign
Year dc:date
2018

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Li, Zebo
Contributors dc:contributor
  • Trinkle, Dallas R.
  • Bellon, Pascal
  • Averback, Robert S.
  • Zhang, Yang
  • Heuser, Brent J.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • Copyright 2017 Zebo Li
Language dc:language
en

Identifiers

dc:identifier.*
Handle dc:identifier
http://hdl.handle.net/2142/99175
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/99175

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Li, Zebo. Multi-scale investigation of vacancy-mediated diffusion of Si in Ni near an edge dislocation. Dissertation thesis, University of Illinois at Urbana-Champaign, 2018. http://hdl.handle.net/2142/99175