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University of Illinois at Urbana-Champaign
Reliability−based topology optimization frameworks for the design of structures subjected to random excitations
Abstract
dc:descriptionEmbargo set by: Seth Robbins for item 95486 Lift date: 2018-11-10T18:43:22Z Reason: Author requested U of Illinois access only (OA after 2yrs) in Vireo ETD system
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Civil Engineering
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2016
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Chun, Junho
- Contributors dc:contributor
-
- Paulino, Glaucio H.
- Song, Junho
- Menezes, Ivan F.M.
- Elbanna, Ahmed E.
- Tovar, Andrés
- Baker, William F.
Subjects
dc:subject × 14- Topology optimization
- Stochastic excitation
- Reliability-based design optimization
- Reliability-based topology optimization
- Parameter sensitivity
- Discrete representation
- Multiresolution
- Polygonal elements
- Forced vibration optimization
- System reliability
- Sequential compounding method
- First-passage probability
- Ground structure
- discrete filtering
Rights
dc:rights- Statement dc:rights
-
- © 2016 by Junho Chun. All rights reserved.
- Language dc:language
- en
Identifiers
dc:identifier.*- Handle dc:identifier
- http://hdl.handle.net/2142/93063
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/93063