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University of Illinois at Urbana-Champaign

Thin -Film Adhesion Measurement by Laser -Induced Stress Waves

Abstract

dc:description

Based on the theoretical and experimental parametric study results, the planar tensile sample geometry is modified to a triangular prism so that a high strain rate shear wave is generated and then allowed to impinge upon the test film. By allowing the initial longitudinal wave to mode convert to a shear wave and a secondary longitudinal wave at the oblique surface, mixed-mode loading of the thin film interface is realized. Film failure under mixed-mode conditions is observed and the mixed-mode interfacial strength is measured and compared with the tensile case.

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Theoretical and Applied Mechanics
Grantor
University of Illinois at Urbana-Champaign
Year dc:date
2015

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Wang, Junlan
Contributors dc:contributor
  • Sottos, Nancy R.
  • Weaver, Richard L.

Subjects

dc:subject × 1

Rights

Language dc:language
eng

Identifiers

dc:identifier.*
Identifier
(MiAaPQ)AAI3070468
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/87710

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Wang, Junlan. Thin -Film Adhesion Measurement by Laser -Induced Stress Waves. Dissertation thesis, University of Illinois at Urbana-Champaign, 2015. http://hdl.handle.net/2142/87710