Lattice Strain Measurements of Deuteride Phase Formation in Epitaxial Niobium on Sapphire

Evidence of significant dislocation formation has been confirmed with high-resolution electron microscopy (HREM) for the 1200A Nb film. The HREM images were used to estimate a dislocation density of 1012 cm-2 after repeated cycling. A residual out-of-plane compressive strain was observed in the 1200A Nb film after complete deuterium evolution. This observation can be explained by irreversible interstitial dislocation loop formation.

Name thesis:degree_name

Ph.D.

Level thesis:degree_level

Dissertation

Discipline thesis:degree_discipline

Nuclear Engineering

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2015

Author dc:creator

• Allain, Monica Marie Cortez

Contributors dc:contributor

• Heuser, Brent J.

• Engineering, Materials Science

Language dc:language

eng

Identifier

(MiAaPQ)AAI3130870

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/85899