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University of Illinois at Urbana-Champaign

The Competing Roles of Microstructure and Flaw Size on the Fatigue Limit of Metals

Abstract

dc:description

Research includes the development and verification of an analytical model that addresses the fatigue process, namely the threshold condition of non-propagating cracks. Two parameters are identified to govern the fatigue resistance: non-propagating crack size and crack barrier strength. The concept of three defect types associated with three different flaw dominated fatigue regimes is introduced. Furthermore, application of the model to fatigue mechanisms in high strength steels, synergistic effects of surface finish and intergranular cracks, competition between surface and subsurface fatigue nucleation, and unexplained observations and scatter in fatigue behavior is demonstrated. Overall, the model is proven as a simple and robust tool for qualifying and statistically quantifying material behavior. In addition, the model can be implemented in material screening, selection, and processing as well as a guide for future material research and design.

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Mechanical Engineering
Grantor
University of Illinois at Urbana-Champaign
Year dc:date
2015

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • McGreevy, Timothy Edward
Contributors dc:contributor
  • Darrell Socie

Subjects

dc:subject × 1

Rights

Language dc:language
eng

Identifiers

dc:identifier.*
Identifier
(MiAaPQ)AAI9904539
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/83970

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

McGreevy, Timothy Edward. The Competing Roles of Microstructure and Flaw Size on the Fatigue Limit of Metals. Dissertation thesis, University of Illinois at Urbana-Champaign, 2015. http://hdl.handle.net/2142/83970