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University of Illinois at Urbana-Champaign
Investigation of the Interface Recombination Velocity of Native Oxide/iii-V Semiconductor Interfaces
Abstract
dc:descriptionThe activation energy of the IRV was extracted from variable temperature TRPL measurements performed on selected samples. The activation energies of the interface recombination velocities agreed with previously established results on unoxidized material interfaces.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Electrical Engineering
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2015
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Curtis, Anthony Paul
- Contributors dc:contributor
-
- Stillman, Gregory E.
Subjects
dc:subject × 1Rights
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
- (MiAaPQ)AAI9904427
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/81239