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University of Illinois at Urbana-Champaign
Sequential Circuit Test Generation Using Genetic Techniques
Abstract
dc:descriptionFinally, synchronizing sequences can greatly benefit test generation. Finding these sequences, however, is nontrivial. The GA is applied to find short synchronizing sequences, and applications of these sequences are also discussed.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Electrical Engineering
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2015
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Hsiao, Michael Shaun
- Contributors dc:contributor
-
- Patel, Janak H.
Subjects
dc:subject × 1Rights
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
- (MiAaPQ)AAI9812627
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/81208