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University of Illinois at Urbana-Champaign
Measurement, Modeling, and Simulation of Fast Transients in ESD Devices
Abstract
dc:descriptionWe also investigated LVTSCR structures fabricated in a commercial CMOS technology, including measuring the turn-on time of LVTSCR ESD protection devices. A circuit simulation macromodel for use in circuit simulation tools has also been incorporated into the Illinois Electrothermal Simulator (iETSIM). A complete discussion of SCRs as ESD protection devices and our measurement/modeling work is given herein.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Electrical Engineering
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2015
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Juliano, Patrick Alfred
- Contributors dc:contributor
-
- Rosenbaum, Elyse
Subjects
dc:subject × 1Rights
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
- (MiAaPQ)AAI3023088
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/80733