Abstract
dc:descriptionThis dissertation focuses on developing a distributed field-effect transistor (FET) small-signal model that is accurate from do to 110 GHz for a wide range of bias conditions. The distributed model is intended to be compatible with a large-signal implementation. The distributed model performance is compared with that of a standard lumped-element model. Skin effect in the gate conductor is analyzed. High-frequency measurement issues are also discussed.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Electrical Engineering
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2015
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Caruth, David Charles
- Contributors dc:contributor
-
- Feng, Milton
Subjects
dc:subject × 1Rights
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
- (MiAaPQ)AAI3023028
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/80727