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University of Illinois at Urbana-Champaign
Measuring the Electronic Structure of Atomically Uniform Silver Films Grown on Silicon Using Angle-Resolved Photoemission Spectroscopy
Abstract
dc:descriptionAs the film thickness increases, the electronic structure evolves to form the bulk band continuum plus separates surfaces states. A careful analysis of this evolution allows us to separate surface from bulk effects, an important and troubling problem in photoemission spectroscopy. As a result, we are able to clearly identify, for the first time, many surface states buried in the pockets of the d-band manifold that had previously only been theoretically predicted.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Physics
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2015
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Speer, Nathan James
- Contributors dc:contributor
-
- Tai Chiang
Subjects
dc:subject × 1Rights
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
- (MiAaPQ)AAI3337905
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/80585