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University of Illinois at Urbana-Champaign
Automatic Test Generation Techniques for Sequential Circuits
Abstract
dc:descriptionFinally, a GA-based diagnostic test generation approach is proposed for sequential circuits. A simple GA, which interacts with an efficient diagnostic fault simulator, is proposed to target groups of undistinguished fault pairs iteratively. Efficient data structures are used and heuristics are proposed to seed the initial populations of the GA. Experimental results also demonstrate the efficiency of the proposed method.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Education
- Grantor
- University of Illinois at Urbana-Champaign
- Date dc:date
- 10000-01-01
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Yu, Xiaoming
- Contributors dc:contributor
-
- Elizabeth M. Rudnick
Subjects
dc:subject × 1Rights
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
- (MiAaPQ)AAI3070489
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/79712