University of Illinois at Urbana-Champaign
Optical Processes in Xenon: Multiphoton Ionization and Ultraviolet Photodissociation of the Dimer Ion
Abstract
dc:descriptionThe coefficient for two-photon ionization of xenon at 193 nm has been measured using a microwave absorption scheme which determines peak electron densities. The electron-neutral collision frequency, (nu)(,m), has been obtained using a microwave bridge and the result is consistent with 0.7 eV electrons. It is found that when an ArF and an XeF excimer laser are fired simultaneously, the electron density is enhanced by at least an order of magnitude due to a near resonance with the Xe 6p{ 1/2}(,0) level. The strong excitation of this state has allowed the measurement of its radiative lifetime and self quenching rate constant. Under high pressure conditions, the dimer ion (Xe(,2)('+)) quickly forms from the atomic ion, and photodissociation on the 1( 1/2)(,u) (--->) 2( 1/2)(,g) band has been observed after sequential UV pumping. Finally, the role of Xe(,2)('+) in the formation of the excimers XeCl and Xe(,2)Cl has been examined.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Physics
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2015
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- McCown, Andrew William
Subjects
dc:subject × 1Rights
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
- (UMI)AAI8324602
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/77354