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University of Illinois at Urbana-Champaign

Debye-Waller Measurements in Silicon

Abstract

dc:description

Made available in DSpace on 2015-05-12T22:39:09Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 7500318.PDF: 1619026 bytes, checksum: a990eb019e408b68fcb567b5304d9646 (MD5) Previous issue date: 1974

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Physics
Grantor
University of Illinois at Urbana-Champaign
Year dc:date
2015

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Hardy, William Harold, II

Subjects

dc:subject × 1

Rights

Language dc:language
eng

Identifiers

dc:identifier.*
Identifier
(UMI)AAI7500318
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/76984

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Hardy, William Harold, II. Debye-Waller Measurements in Silicon. Dissertation thesis, University of Illinois at Urbana-Champaign, 2015. http://hdl.handle.net/2142/76984