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University of Illinois at Urbana-Champaign

The Error-Related Negativity: Evidence for a Neural Mechanism for Error-Related Processing

Abstract

dc:description

The analysis of response-locked event-related potential (ERP) waveforms from several experiments points to the existence of a neural system involved in processing information associated with errors in choice reaction time tasks. The experiments included a sentence verification task, a Sternberg memory search task, and two letter discrimination tasks. In all these experiments, a negative-going deflection (the error-related negativity, or ERN) in the event-related brain potential began around the time of error onset and peaked about 100 msec later. It ranged in amplitude from 3 to 10 microvolts, was bilaterally symmetrical, and had a scalp distribution maximal at central and frontal electrode sites. The ERN was not evident on correct trials.

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Psychology
Grantor
University of Illinois at Urbana-Champaign
Year dc:date
2014

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Gehring, William Joseph
Contributors dc:contributor
  • Coles, Michael G.H.

Subjects

dc:subject × 3

Identifiers

dc:identifier.*
Identifier
(UMI)AAI9305534
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/72113

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Gehring, William Joseph. The Error-Related Negativity: Evidence for a Neural Mechanism for Error-Related Processing. Dissertation thesis, University of Illinois at Urbana-Champaign, 2014. http://hdl.handle.net/2142/72113