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University of Illinois at Urbana-Champaign
Effect of Resistance Type on the Development of and Yield Losses Due to Northern Corn Leaf Blight
Abstract
dc:descriptionThe effect of resistant type on the development of northern leaf blight (NLB), caused by Exserohilum turcicum, was studied on three dent corn (Zea mays L.) hybrids: A619 x A632, B73 x Oh545 and Mo17 x B73. Two nearly isogenic versions of each hybrid were used, one version carrying the resistance gene Ht1 and the second carrying the corresponding allele for susceptibility, ht1. Plots were inoculated at one of five different times, corresponding to growth stages (GS) 2 through 6.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Plant Pathology
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2014
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Perkins, James Milton
Subjects
dc:subject × 1Identifiers
dc:identifier.*- Identifier
- (UMI)AAI8610969
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/70604