Imaging of Transient Analytical Plasmas Using Charge-Coupled Device Detectors

The goal of this work has been to better understand analytical atomic emission sources. Heavy reliance on engineering designs of predecessors is exhibited, with the exception of charge coupled device (CCD) detection technology. The incorporation of a CCD into a high energy source spectroscopy laboratory is documented, considering device selection, hardware and software engineering, operating procedures, importance of simultaneous multi-dimensional detection, and system performance.

Name thesis:degree_name

Ph.D.

Level thesis:degree_level

Dissertation

Discipline thesis:degree_discipline

Chemistry

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2014

Author dc:creator

• Mork, Brian James

• Chemistry, Analytical
• Physics, Fluid and Plasma
• Computer Science

Identifier

(UMI)AAI8908786

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/70430