University of Illinois at Urbana-Champaign
Use of High-Level Descriptions in Fault Simulation and Test Generation
Abstract
dc:descriptionThe goals of this thesis are to study and demonstrate the advantage of using functional descriptions for fault simulation and test generation. By using functional descriptions, high-level functional modules are treated as circuit primitives, as compared with low-level gates and flip-flops which are used in conventional approaches, and the number of primitives elements in a circuit can be significantly reduced. This reduces the computation needed for fault simulation and test generation. In many instances, functional descriptions are also easier to obtain than detailed gate-level implementations. With the functional approach, various fault models can be incorporated as the need arises, which allows more realistic fault models to be used.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Electrical Engineering
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2014
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Chang, Hong-Tao Paul
- Contributors dc:contributor
-
- Abraham, Jacob A.
Subjects
dc:subject × 2Identifiers
dc:identifier.*- Identifier
- (UMI)AAI8802994
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/69367