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University of Illinois at Urbana-Champaign
Theoretical Study of the Transverse Dielectric Constant of Superlattices and Their Alloys (Refraction, Absorption)
Abstract
dc:descriptionThe optical properties of III-V binary and ternary compounds and GaAs-Al(,x)Ga(,1-x)As superlattices are determined by calculating the real and imaginary parts of the transverse dielectric constant, (epsilon)((omega)) = (epsilon)(,1)((omega)) + i(epsilon)(,2)((omega)). Emphasis is given to determining the influence of different material and superlattice (layer thickness and Al composi- tion) parameters on the values of the index of refraction. (eta)((omega)) and absorption coefficient, (alpha)((omega)).
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Electrical Engineering
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2014
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Kahen, Keith Brian
Subjects
dc:subject × 1Identifiers
dc:identifier.*- Identifier
- (UMI)AAI8701519
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/69343