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University of Illinois at Urbana-Champaign
Impact Ionization in Charge Coupled Devices
Abstract
dc:descriptionA charge coupled device was designed and fabricated for the purpose of measuring impact ionization at the silicon-silicon dioxide interface. All past experiments have measured impact ionization either totally or partly in the bulk. Since the mobility of holes and electrons is lower at the interface than in the bulk, the impact ionization coefficient should be different due to the increased scattering.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Electrical Engineering
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2014
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Detry, James Francis
Subjects
dc:subject × 1Identifiers
dc:identifier.*- Identifier
- (UMI)AAI8324535
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/69254