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University of Illinois at Urbana-Champaign

Computer-Automated Electrical Characterization of Semiconductor Devices

Abstract

dc:description

Made available in DSpace on 2014-12-12T20:54:30Z (GMT). No. of bitstreams: 1 7709080.pdf: 3686200 bytes, checksum: 7adfa8bbe90c26249e6dcf0f63546c30 (MD5) Previous issue date: 1976

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Electrical Engineering
Grantor
University of Illinois at Urbana-Champaign
Year dc:date
2014

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Lo, Thomas Ying-Ching

Subjects

dc:subject × 1

Rights

Language dc:language
eng

Identifiers

dc:identifier.*
Identifier
(UMI)AAI7709080
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/66132

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Lo, Thomas Ying-Ching. Computer-Automated Electrical Characterization of Semiconductor Devices. Dissertation thesis, University of Illinois at Urbana-Champaign, 2014. http://hdl.handle.net/2142/66132