Measurement of Change of Thickness for a Thin Plate by Holographic Interferometry

Hu, Ching-Piao

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University of Illinois at Urbana-Champaign

Measurement of Change of Thickness for a Thin Plate by Holographic Interferometry

dc:creator Hu, Ching-Piao

thesis:degree_name Ph.D.

dc:date2014

Abstract

dc:description

Made available in DSpace on 2014-12-12T00:25:58Z (GMT). No. of bitstreams: 1 7511859.pdf: 1624412 bytes, checksum: 881ef135a6213ff616cb24ce500bfa94 (MD5) Previous issue date: 1974

Degree

thesis:*

Name thesis:degree_name: Ph.D.
Level thesis:degree_level: Dissertation
Discipline thesis:degree_discipline: Theoretical and Applied Mechanics
Grantor: University of Illinois at Urbana-Champaign
Year dc:date: 2014

Author and committee

dc:creator, dc:contributor.*

Author dc:creator: Hu, Ching-Piao

Subjects

dc:subject × 1

Applied Mechanics

Identifiers

dc:identifier.*

Identifier: (UMI)AAI7511859
OAI identifier oai:identifier: oai:www.ideals.illinois.edu:2142/65283

Chain of custody

source

Harvested from: University of Illinois - Urbana-Champaign
Base URL: www.ideals.illinois.edu/oai-pmh
Last updated: 2026-07-22
Source record: OAI-PMH GetRecord

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citation

Hu, Ching-Piao. Measurement of Change of Thickness for a Thin Plate by Holographic Interferometry. Dissertation thesis, University of Illinois at Urbana-Champaign, 2014. http://hdl.handle.net/2142/65283

Measurement of Change of Thickness for a Thin Plate by Holographic Interferometry

Abstract

Degree

Author and committee

Subjects

Identifiers

Chain of custody

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