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University of Illinois at Urbana-Champaign
Internal Structure of an Electronics Achievement Test Examined by a Principal Axes Analysis and a Homogeneous Clustering Technique
Abstract
dc:descriptionMade available in DSpace on 2014-12-04T17:32:54Z (GMT). No. of bitstreams: 1 0009144.pdf: 6322207 bytes, checksum: f1d5bc91a75eac8f323c5d2912bda0b5 (MD5) Previous issue date: 1954
Degree
thesis:*- Name thesis:degree_name
- Educat.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Education
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2014
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Smith, Lyman John
Subjects
dc:subject × 1Rights
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
- (UMI)AAI0009144
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/56406