Transistor level X-parameter simulations of equalization circuits

As frequencies have increased in circuits used for communication electronics, signal integrity concepts have become some of the foremost challenges that circuit designers must deal with. Specifically, high-speed links have been the focus of much of the research into mitigating signal integrity issues. To combat the effects of jitter and other signal integrity problems, circuit designers have begun using increasingly more complex circuitry peripheral to the high-speed link. This presents a challenge for system level designers because of their reliance on models accurately characterizing the underlying transistor level design. Existing standards, such as IBIS-AMI, are currently used at the system level to create designs. Alternatively, X-parameters may present a more intuitive and accurate method to generate models that are detailed and that preserve intellectual property.

Name thesis:degree_name

M.S.

Level thesis:degree_level

Thesis

Discipline thesis:degree_discipline

Electrical & Computer Engr

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2014

Author dc:creator

• Newell, Drew

Contributors dc:contributor

• Schutt-Ainé, José E.

• signal integrity
• x-parameter
• ibis

Statement dc:rights

• Copyright 2014 Drew J. Newell

Language dc:language

en

Handle dc:identifier

http://hdl.handle.net/2142/49409

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/49409