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University of Illinois - Urbana-Champaign

Properties of 1-MeV-electron-irradiated defect centers in silicon

Abstract

dc:description

Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by William Weathers (weathrs2@illinois.edu) on 2012-04-16T20:29:19Z Item is restricted indefinitely.

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Physics
Year dc:date
2012

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Walker, James Wiley
Contributors dc:contributor
  • Sah, C.T.

Subjects

dc:subject × 2

Rights

dc:rights
Statement dc:rights
  • ©1973 Walker
Language dc:language
en

Identifiers

dc:identifier.*
Identifier
2367987

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Walker, James Wiley. Properties of 1-MeV-electron-irradiated defect centers in silicon. Dissertation thesis, 2012. http://hdl.handle.net/2142/30654