Anomalous X-ray transmission changes in copper crystals on electron irradiation at 14 K

Anomalous X-ray transmission measurements were made at.4,2 K on nearly perfect crystals before and after irradiation at 14 Kwith 3 MeV electrons, Simultaneous resistance measurements were taken on high purity copper wires, The measured intensity changes for (111), (222), (333), (220), (200), and (400) reflecting planes were investigated at intervals during the irradiation, Annealing studies at 22 K, 37 K, 78 K, and 295 K show X-ray intensity recoveries similar to resistance recoveries. Resistance increases show a linear dependence with electron fluence while transmitted X-ray intensity decreases show a greater than linear dependence. Resistance changes with dose were comparable with previous data, X-ray intensity decreases appear to be greater than predicted for the estimated concentration of point defects, A second irradiation of the transmission specimen after a long room temperature anneal led to decreases in transmitted intensity which were about twice the changes seen after a similar electron fluence in the first irradiation.

Name thesis:degree_name

Ph.D.

Level thesis:degree_level

Dissertation

Discipline thesis:degree_discipline

Physics

Year dc:date

2012

Author dc:creator

• Brown, Bruce Stilwell

• Copper
• copper crystals
• anomalous x-ray transmission

Statement dc:rights

• © Bruce Stilwell Brown

Language dc:language

en

Identifier

2935692

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/29949