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University of Illinois - Urbana-Champaign

Debye-Waller Measurements in Silicon

Abstract

dc:description

Submitted by Jesse Garrison (jagarris@illinois.edu) on 2012-01-11T22:08:51Z No. of bitstreams: 1 1974_hardy.pdf: 1936467 bytes, checksum: 3957705d7ca9a62f897cbe640722d175 (MD5)

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Physics
Year dc:date
2012

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Hardy, William Harold, II
Contributors dc:contributor
  • Simmons, R.O.

Subjects

dc:subject × 3

Rights

dc:rights
Statement dc:rights
  • © 1974 William Harold Hardy, II
Language dc:language
en

Identifiers

dc:identifier.*
Identifier
3254026
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/28642

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Hardy, William Harold, II. Debye-Waller Measurements in Silicon. Dissertation thesis, 2012. http://hdl.handle.net/2142/28642