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University of Illinois - Urbana-Champaign
Scattering of Conduction Electrons by Surface Oxide Charge at the Silicon-Silicon Dioxide Interface
Abstract
dc:descriptionSubmitted by Jesse Garrison (jagarris@illinois.edu) on 2011-07-08T17:56:44Z No. of bitstreams: 1 1971_tschopp.pdf: 4081394 bytes, checksum: 8f7a857b43bf06c2a7b8ba1fc7c71451 (MD5)
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Physics
- Year dc:date
- 2011
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Tschopp, Larry LeRoy
- Contributors dc:contributor
-
- Sah, C.T.
Subjects
dc:subject × 3Rights
dc:rights- Statement dc:rights
-
- © 1971 Larry LeRoy Tschopp
- Language dc:language
- en
Identifiers
dc:identifier.*- Identifier
- 2674870
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/25728