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University of Illinois at Urbana-Champaign
Code-error calibration techniques for two-step flash analog-to-digital converters
Abstract
dc:descriptionFlash-type analog-to-digital converters (ADCs) have been extensively used for high-speed applications such as high-performance TVs, image recognition, radar, and medical instrumentation. However, the linearity of these state-of-the-art flash-type ADCs has been limited to 10 bits by ratio mismatch of passive components. Although techniques such as laser-trimming, self-calibration and error-averaging have been developed to achieve high matching accuracy of components, they are not readily applied to flash-type ADCs.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Engineering, Electronics and Electrical
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2011
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Lee, Seung-Hoon
- Contributors dc:contributor
-
- Song, Bang-Sup
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- Copyright 1991 Lee, Seung-Hoon
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
-
AAI9136650
(UMI)AAI9136650 - OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/23592