Compressed and dynamic fault dictionaries for fault isolation

This thesis addresses many of the issues that have in the past limited the use of fault dictionaries for VLSI fault isolation. Dictionary formats have been analyzed, and a new, more accurate matching algorithm has been developed. Alternative techniques for compressing fault dictionaries have been investigated to address size and computation cost issues. Two new compression algorithms are presented. List Splitting creates fault dictionaries with a single full fault simulation and provides for rapidly estimating the diagnostic capabilities of a test set. Sequential compression makes no approximations for sequential circuits and thus loses no resolution; however, it costs more than List Splitting, requiring two fault simulations.

Name thesis:degree_name

Ph.D.

Level thesis:degree_level

Dissertation

Discipline thesis:degree_discipline

Electrical and Computer Engineering

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2011

Author dc:creator

• Ryan, Paul George

Contributors dc:contributor

• Fuchs, W. Kent

• Engineering, Electronics and Electrical

Statement dc:rights

• Copyright 1994 Ryan, Paul George

Language dc:language

eng

Identifier

AAI9512534
(UMI)AAI9512534

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/23250