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University of Illinois at Urbana-Champaign

Fault covers in reconfigurable VLSI chips

Abstract

dc:description

Reconfigurable chips can be used to enhance the yield of chip production. These chips contain redundant elements that can be used to replace the defective elements. The fault covering problem is to assign the redundant elements to the defective elements such that the chip will function properly. We studied fault covering problems on special architectures, Random Access Memories and Programmable Logic Arrays, and developed a general formulation and algorithm for solving fault covering problems on a large class of reconfigurable chips.

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Computer Science
Grantor
University of Illinois at Urbana-Champaign
Year dc:date
2011

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Hasan, Nany
Contributors dc:contributor
  • Liu, C.L.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • Copyright 1990 Hasan, Nany
Language dc:language
eng

Identifiers

dc:identifier.*
Identifier
AAI9114261
(UMI)AAI9114261
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/22774

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Hasan, Nany. Fault covers in reconfigurable VLSI chips. Dissertation thesis, University of Illinois at Urbana-Champaign, 2011. http://hdl.handle.net/2142/22774