Techniques for automatic test knowledge extraction from compiled circuits

In the past, research has shown that the use of high-level test knowledge can be used to greatly accelerate the test generation process. The problem was that no techniques were developed to extract this knowledge from a circuit. Typically, the only solution for a circuit designer was to manually extract the test knowledge. When designers are using sophisticated high-level synthesis tools (e.g., a silicon compiler), the designer may not be competent to extract this type of knowledge. In this thesis, solutions to the problem of automatically extracting this high-level knowledge from the structure of a compiled circuit are presented.

Name thesis:degree_name

Ph.D.

Level thesis:degree_level

Dissertation

Discipline thesis:degree_discipline

Electrical and Computer Engineering

Grantor

University of Illinois at Urbana-Champaign

Year dc:date

2011

Author dc:creator

• Thearling, Kurt Henry

Contributors dc:contributor

• Abraham, Jacob A.

• Engineering, Electronics and Electrical
• Artificial Intelligence
• Computer Science

Statement dc:rights

• Copyright 1990 Thearling, Kurt Henry

Language dc:language

eng

Identifier

AAI9114437
(UMI)AAI9114437

OAI identifier oai:identifier

oai:www.ideals.illinois.edu:2142/22562