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University of Illinois at Urbana-Champaign
Photoemission and photoelectron diffraction studies of semiconductor surfaces
Abstract
dc:descriptionSeveral experimental surface science techniques, such as photoelectron diffraction (PED), photoemission extended fine structure (PEFS), and photoelectron holography (PEH), rely upon the measurement of the interference due to the photoelectron wave scattering from nearby atoms. The intensity oscillations in the data are analyzed by comparison to theoretical models (PED), direct inversion to yield bond lengths (PEFS), or direct inversion to obtain a three-dimensional image (PEH). This thesis describes several experiments in which high-resolution photoemission spectroscopy, PEFS, and PEH have been employed to study the atomic structure of semiconductor surfaces.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Physics
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2011
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Sieger, Matthew Thomas
- Contributors dc:contributor
-
- Chiang, Tai-Chang
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- Copyright 1996 Sieger, Matthew Thomas
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
-
9780591088557
AAI9702664
(UMI)AAI9702664 - OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/22503