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University of Illinois at Urbana-Champaign
Probabilistic simulation for reliability analysis of VLSI circuits
Abstract
dc:descriptionThis thesis presents a new technique for simulating integrated circuits, called probabilistic simulation. Using this technique, statistical descriptions of the voltage waveforms at the circuit primary inputs are used to derive corresponding statistical descriptions of the internal voltages and currents. To illustrate its utility, we use this approach to analyze integrated circuit reliability. Specifically, we focus on the problem of predicting the susceptibility of a given design to electromigration failures.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Electrical Engineering
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2011
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Najm, Farid Nasri
- Contributors dc:contributor
-
- Hajj, Ibrahim N.
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- Copyright 1989 Najm, Farid Nasri
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
-
AAI9010965
(UMI)AAI9010965 - OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/21610